时间：2016.5.26（周四），下午2点30分―4点30分
地点：工业电子技术楼（即应电楼）401室
讲座内容：
1) Introduction to CORPE – Center Of Reliable Power Electronics
2) Instability in Power Devices
3) Case study: short circuit instabilities in modern power modules
4) Recent and perspective activities: TSEP methods and Advanced Gate Driving techniques
主讲人：Prof. Francesco Iannuzzo
Prof. Francesco Iannuzzo received the M.Sc. degree in Electronic Engineering and the Ph.D. degree in Electronic and Information Engineering from the University of Naples, Italy, in 1997 and 2001, respectively. He is primarily specialized in power device modeling.
From 2000 to 2006, he has been a Researcher with the University of Cassino, Italy, where he became Aggregate Professor in 2006 and he is currently Associate Professor since 2012. In 2014 he got a contract as professor in Reliable Power Electronics at the Aalborg University, Denmark, where he is also part of CORPE (Center Of Reliable Power Electronics). He is author or co-author of more than 100 publications on journals and international conferences, and one patent on an innovative inverter topology for very compact, galvanic-isolated auxiliary power supply for heavy train applications. His research interests are in the field of reliability of power devices, including cosmic rays, power device failure modelling and testing of power modules up to MW-scale under extreme conditions, like overvoltage, overcurrent, overtemperature and short circuit.
Prof. Iannuzzo was the Technical Programme Committee co-Chair in two editions of ESREF, the European Symposium on Reliability and Failure analysis. He is a senior member of the IEEE (Reliability Society, Electron Device Society, Industrial Electronic Society and Industry Application Society) and he permanently serves as expert and peer reviewer for several conferences and journals in the field, like: APEC, ECCE, EPE, ESREF, IECON, Elsevier Microelectronics Reliability, IEEE Transactions on Industrial Electronics and Transactions on Power Electronics.
欢迎各位老师、本科高年级及研究生同学积极参加！
9159金沙游戏场应用电子学系
2016.5
